JEOL IT300 Scanning Electron Microscope
| MANUFACTURER | JEOL(manufacturer's website) |
|---|---|
| MODEL | IT300 |
| ACRONYM | SEM |
Chemistry
| AVAILABILITY | 09:00-17:00 Mon-Fri |
|---|---|
| TRAINING | Training is required to use this item and we can arrange this if needed. |
| CONTACT 1 | Sean Davis |
|---|---|
| Enquire about this item | |
| SITE | Main Campus |
Description
An IT300 Scanning Electron Microscope (JEOL)
Specification
Sample must be conductive
Upgrades
EDX detector for elelemtal analysis
Potential Future Upgrades
Item ID #.
Last Updated: 30th June, 2015
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