MANUFACTURER | Various |
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MODEL | IAC magnetic sector SIMS/ion milling instrument |
ACRONYM | Mag sector SIMS |
AVAILABILITY | 24/7 |
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CONTACT 1 | k.r.hallam@bristol.ac.uk |
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Enquire about this item | |
SITE | Main Campus |
High sensitivity and spatial resolution qualitative analysis of surface elemental & molecular composition, imaging, depth profiling, high resolution ion milling.
Gallium ion beam, resolution 100nm. Sample sizes to 20mm
Item ID #
.Last Updated: 18th March, 2014
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