Various IAC magnetic sector SIMS/ion milling instrument
| MANUFACTURER | Various |
|---|---|
| MODEL | IAC magnetic sector SIMS/ion milling instrument |
| ACRONYM | Mag sector SIMS |
Interface Analysis Centre
| AVAILABILITY | 24/7 |
|---|
| CONTACT 1 | k.r.hallam@bristol.ac.uk |
|---|---|
| Enquire about this item | |
| SITE | Main Campus |
Description
High sensitivity and spatial resolution qualitative analysis of surface elemental & molecular composition, imaging, depth profiling, high resolution ion milling.
Specification
Gallium ion beam, resolution 100nm. Sample sizes to 20mm
Upgrades
built in house
Potential Future Upgrades
Item ID #.
Last Updated: 18th March, 2014
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