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Atomic Force /Scanning Probe Micrsoscope - located in a class 1000 cleanroom
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NanoScope 3D multimode AFM
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Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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Confocal laser scanning microscope suitable for multiple fluorophores
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200kV Twin Lens Transmission Electron Microscope with HAADF STEM detector
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Tecnai 12 -FEI 120kV BioTwin SpiritTransmission Electron Microscope (TEM)
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Scanning Electron Microscope
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Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, ph
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A custom-built contact-mode high-speed atomic force microscope (HS-AFM) for imaging nanoscale structures with millisecond time resolution and over macroscale areas.
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Transmission Electron Microscope
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JEOL 6330 FEG SEM with EDX and CL
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120 kV TEM
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Analytical FEG-TEM with STEM, EDX, cryo- and heating holders
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JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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Wide field microscopes
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Confocal Microscope
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Confocal Microscope
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Confocal Microscope
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Widefield fluorescence microscope system
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Multiphoton and confocal microscope
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Confocal laser scanning microscope suitable for live cell imaging and multiple fluorophores
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Spinning disc confocal microscope
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Confocal laser scanning microscope with STED, FLIM and FCS
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Widefield microscope system (inverted)
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Widefield microscope system (inverted)
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Microscope observer Zim
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Scanning Electron Microscope
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