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Viewing items matching the following properties:

Organisational Unit : Faculty of Science [x]
Category : Microscopes [x]

Atomic Force Microscope

Atomic Force /Scanning Probe Micrsoscope - located in a class 1000 cleanroom
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- Manufacturer: Agilent
- Technique: AFM/SPM
Bruker NanoScope 3D

NanoScope 3D multimode AFM
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- Manufacturer: Bruker
- Technique: Scanning Probe microscopy, Atomic Force Microscopy
Bruker Multi-Mode VIII AFM with PFQNM and HSAFM

Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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- Manufacturer: Bruker
- Technique: Atomic Force Microscopy, Scanning Probe Microscopy
FEI FIB201

FIB
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- Manufacturer: FEI
- Technique: Focused Ion Beam
FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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- Manufacturer: FEI
- Technique: Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM)
Field emission gun scanning electron microscope

Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, ph
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- Manufacturer: Zeiss
- Technique: Scanning electron microscopy
High-speed atomic force microscope

A custom-built contact-mode high-speed atomic force microscope (HS-AFM) for imaging nanoscale structures with millisecond time resolution and over macroscale areas.
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- Manufacturer: University of Bristol
- Technique: Atomic force microscopy
JEOL JSM 6330 F Field Emission Scanning Electron Microscope

JEOL 6330 FEG SEM with EDX and CL
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- Manufacturer: JEOL
- Technique: Scanning electron microscopy, Energy-dispersive X-ray spectroscopy, Cathodoluminescence
JEOL 1200 MK2 TEM

Transmission Electron Microscope
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- Manufacturer: JEOL
- Technique: Transmission Electron Microscopy
JEOL 1400 TEM

120 kV TEM
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- Manufacturer: JEOL
- Technique: Transmission Electron Micoscopy, Energy-dispersive X-ray spectroscopy, Electron Diffraction
Jeol 2100F Field Emission Gun Transmission Electron Microscope

Analytical FEG-TEM with STEM, EDX, cryo- and heating holders
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- Manufacturer: JEOL
- Technique: TEM, EDX, ED, STEM
JEOL IT300 Scanning Electron Microscope

JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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- Manufacturer: JEOL
- Technique: Scanning Electron Microscopy
Zeiss Evo MA10 LaB6 SEM with instrument probe

SEM
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- Manufacturer: Zeiss
- Technique: Scanning Electron Microscope (SEM), EBSD, EDX