|MODEL||IAC magnetic sector SIMS/ion milling instrument|
|ACRONYM||Mag sector SIMS|
|Enquire about this item|
High sensitivity and spatial resolution qualitative analysis of surface elemental & molecular composition, imaging, depth profiling, high resolution ion milling.
Gallium ion beam, resolution 100nm. Sample sizes to 20mm
Item ID #.
Last Updated: 18th March, 2014
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