|MODEL||JAMP30; AES with impact and tensile fracture stages, argon ion gun, concentric mirror and hemispheri|
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Precise small area surface analysis, high energy resolution, quantitative depth resolution, in-situ fracture analysis, surface/bulk composition comparison
JAMP30; AES with impact and tensile fracture stages, argon ion gun, concentric mirror and hemispherical electron energy analysers
Item ID #.
Last Updated: 18th March, 2014
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