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Various IAC magnetic sector SIMS/ion milling instrument

MANUFACTURER Various
MODEL IAC magnetic sector SIMS/ion milling instrument
ACRONYM Mag sector SIMS

Interface Analysis Centre

AVAILABILITY 24/7
CONTACT 1 k.r.hallam@bristol.ac.uk
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SITE Main Campus

Description

High sensitivity and spatial resolution qualitative analysis of surface elemental & molecular composition, imaging, depth profiling, high resolution ion milling.

Specification

Gallium ion beam, resolution 100nm. Sample sizes to 20mm

Upgrades

built in house

Potential Future Upgrades

Item ID #1843.

Last Updated: 18th March, 2014

Various IAC magnetic sector SIMS/ion milling instrument

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