|Zeiss Sigma VP
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Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, phase identification and strain measurement on a point-to-point basis
Item ID #.
Last Updated: 21st January, 2016
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