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Field emission gun scanning electron microscope

MANUFACTURER Zeiss(manufacturer's website)
ACRONYM Zeiss Sigma VP

Interface Analysis Centre

TRAINING Training is required to use this item and we can arrange this if needed.
CONTACT 1 k.r.hallam@bristol.ac.uk
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SITE Main Campus


Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, phase identification and strain measurement on a point-to-point basis

Item ID #1973.

Last Updated: 21st January, 2016

Field emission gun scanning electron microscope

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