AVAILABILITY | M-F 9-5 |
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TRAINING | Training is required to use this item and we can arrange this if needed. |
CONTACT 1 | Sean Davis |
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Enquire about this item | |
SITE | Main Campus |
Facility comprising scanning and transmission electron microscopes and atomic force microscopes
NanoScope 3D multimode AFM
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Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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Transmission Electron Microscope
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JEOL 6330 FEG SEM with EDX and CL
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120 kV TEM
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Analytical FEG-TEM with STEM, EDX, cryo- and heating holders
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JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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Item ID #
.Last Updated: 30th June, 2015
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