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FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

MANUFACTURER FEI
MODEL Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea
ACRONYM Dualbeam

Interface Analysis Centre

AVAILABILITY 24/7
CONTACT 1 k.r.hallam@bristol.ac.uk
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SITE Main Campus

Description

High resolution micromachining, etching, deposition & microscopy, incl secondary electron and backscattered electron SEM, Energy Dispersive X-ray analysis (EDX) and nanomanipulation.

Upgrades

Kleindiek Nanomanipulator, EDX system Oxford Instruments XMax-50), Platinum deposition, Selective carbon mill.

Potential Future Upgrades

cryostage/cryocan, electron backscatter diffraction, 3rd ion gun

Item ID #1847.

Last Updated: 18th March, 2014

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