Sample Preparation

The following equipment and facilities are listed under this category.

• 

  FEI FIB201

  FIB
  more details »

  • Manufacturer: FEI
  • Technique: Focused Ion Beam
  • Organisational Unit: Interface Analysis Centre
• 

  FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

  Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
  more details »

  • Manufacturer: FEI
  • Technique: Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM)
  • Organisational Unit: Interface Analysis Centre
• 

  Leica EM PACT2 + RTS (Rapid transfer system)

  High pressure freezer
  more details »

  • Manufacturer: Leica
  • Technique: Cryofixation
  • Organisational Unit: Wolfson BioImaging Facility
• 

  Leica UC6 + FCS Cryo ultra Microtome

  Ultra microtome
  more details »

  • Manufacturer: Leica
  • Technique: Ultra thin cryo sectioning for Electron Microscopy
  • Organisational Unit: Wolfson BioImaging Facility
• 

  Reichert Jung Ultracut E

  Reichert Jung Room temp microtome
  more details »

  • Manufacturer: Reichert Jung
  • Technique: Ultra thin sectioning for Electron Microscopy
  • Organisational Unit: Wolfson BioImaging Facility
• 

  Reichert Leica Ultracut S

  Leica Room temp microtome
  more details »

  • Manufacturer: Reichert Leica
  • Technique: Ultra thin sectioning for Electron Microscopy
  • Organisational Unit: Wolfson BioImaging Facility
• 

  Various IAC/Oxford; DC magnetron sputter chamber

  Synthesis of epitaxial thin films
  more details »

  • Manufacturer: Various
  • Technique: DC magnetron sputtering
  • Organisational Unit: Interface Analysis Centre

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