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Viewing items matching the following properties:

• Category : Analysers  [x]
• Organisational Unit : University of Bristol  [x]
• manufacturer : FEI  [x]

• 

  FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

  Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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  • Technique: Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM)

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