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Viewing items matching the following properties:

• Category : Microscopes  [x]
• manufacturer : Bruker  [x]
• Organisational Unit : Catalogue  [x]

• 

  Bruker NanoScope 3D

  NanoScope 3D multimode AFM
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  • Technique: Scanning Probe microscopy, Atomic Force Microscopy
• 

  Bruker Multi-Mode VIII AFM with PFQNM and HSAFM

  Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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  • Technique: Atomic Force Microscopy, Scanning Probe Microscopy

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