Browse Items

Viewing items matching the following properties:

• Category : Microscopes  [x]
• Organisational Unit : Interface Analysis Centre  [x]

• 

  FEI FIB201

  FIB
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  • Manufacturer: FEI
  • Technique: Focused Ion Beam
• 

  FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

  Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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  • Manufacturer: FEI
  • Technique: Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM)
• 

  Field emission gun scanning electron microscope

  Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, ph
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  • Manufacturer: Zeiss
  • Technique: Scanning electron microscopy
• 

  High-speed atomic force microscope

  A custom-built contact-mode high-speed atomic force microscope (HS-AFM) for imaging nanoscale structures with millisecond time resolution and over macroscale areas.
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  • Manufacturer: University of Bristol
  • Technique: Atomic force microscopy
• 

  Zeiss Evo MA10 LaB6 SEM with instrument probe

  SEM
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  • Manufacturer: Zeiss
  • Technique: Scanning Electron Microscope (SEM), EBSD, EDX

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