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Viewing items matching the following properties:

Category : Sample Preparation [x]
Organisational Unit : Catalogue [x]

FEI FIB201

FIB
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- Manufacturer: FEI
- Technique: Focused Ion Beam
FEI Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force mea

Helios NanoLab 600; Dualbeam with three-axis micromanipulator, Oxford Inst X-Max50 EDX and force measurement
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- Manufacturer: FEI
- Technique: Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM)
Leica EM PACT2 + RTS (Rapid transfer system)

High pressure freezer
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- Manufacturer: Leica
- Technique: Cryofixation
Leica UC6 + FCS Cryo ultra Microtome

Ultra microtome
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- Manufacturer: Leica
- Technique: Ultra thin cryo sectioning for Electron Microscopy
Reichert Jung Ultracut E

Reichert Jung Room temp microtome
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- Manufacturer: Reichert Jung
- Technique: Ultra thin sectioning for Electron Microscopy
Reichert Leica Ultracut S

Leica Room temp microtome
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- Manufacturer: Reichert Leica
- Technique: Ultra thin sectioning for Electron Microscopy
Various IAC/Oxford; DC magnetron sputter chamber

Synthesis of epitaxial thin films
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- Manufacturer: Various
- Technique: DC magnetron sputtering

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