FEI FIB201
| MANUFACTURER | FEI |
|---|---|
| MODEL | FIB201 |
| ACRONYM | FIB |
Interface Analysis Centre
| AVAILABILITY | 24/7 |
|---|
| CONTACT 1 | k.r.hallam@bristol.ac.uk |
|---|---|
| Enquire about this item | |
| SITE | Main Campus |
Description
High resolution micromachining, etching, deposition & microscopy, TEM sample preparation and sectioning, IC modification.
Specification
7nm resolution Platinum deposition Enhanced etch (iodine) Insulator enhanced etch (XeF2) Selective carbon mill (water)
Item ID #.
Last Updated: 18th March, 2014
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