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Viewing items matching the following properties:

• manufacturer : Zeiss  [x]
• Organisational Unit : University of Bristol  [x]
• technique : Scanning electron microscopy  [x]
• Category : Microscopes  [x]

• 

  Field emission gun scanning electron microscope

  Zeiss Sigma VP FEG-SEM with Edax coincident EDX/EBSD, backscattered electron detector, large sample chamber, motorised stage and Omicron argon ion gun for general SEM and elemental analysis of large samples, crystal orientation imaging microscopy, ph
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