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NanoScope 3D multimode AFM
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Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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JEOL 6330 FEG SEM with EDX and CL
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Transmission Electron Microscope
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120 kV TEM
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Analytical FEG-TEM with STEM, EDX, cryo- and heating holders
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JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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