Viewing items matching the following properties:
			NanoScope 3D multimode AFM 
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			Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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			JEOL 6330 FEG SEM with EDX and CL
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			Transmission Electron Microscope
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			120 kV TEM
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			Analytical FEG-TEM with STEM, EDX, cryo- and heating holders
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			JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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