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Viewing items matching the following properties:

• technique : Atomic Force Microscopy, Scanning Probe Microscopy  [x]
• manufacturer : Bruker  [x]

• 

  Bruker Multi-Mode VIII AFM with PFQNM and HSAFM

  Bruker MMVIII AFM with capability for high-speed imaging and simultaneously mapping physical properties (mechanical, magnetic, electrical)
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  • Organisational Unit: Chemistry

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