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Viewing items matching the following properties:

• technique : Scanning electron microscopy  [x]
• manufacturer : JEOL  [x]
• Organisational Unit : Faculty of Science  [x]
• Category : Spectroscopy  [x]

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  JEOL IT300 Scanning Electron Microscope

  JEOL IT300 SEM with Oxford Instruments XMAX 80 EDX
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